VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
ISBN 13: 9780123705976
ISBN: 0123705975
Edition: 1
Publisher: Morgan Kaufmann
Format: Hardcover (808 pages)
Released: Jul 21st, 2006
Related ISBN: 9780080474793
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